曲面 Pattern 缺陷检测

本网站整理了一组关于曲面 Pattern 缺陷检测的文章，内容涵盖问题本体、模板组织、XML 配置、两层配准、缺陷测量、配置路由、多线程、插件机制与工程落地。

这些讨论基于一套核心检测系统：该系统开发于 2020 年，并于 2021 至 2023 年间在 Apple AirPods 相关产线上实现规模化部署。

This site presents a series of articles on curved-surface pattern inspection, covering problem formulation, template organization, XML configuration, two-layer registration, defect measurement, configuration routing, multithreading, plugin mechanisms, and industrial deployment.

The discussion is based on a core inspection system developed in 2020 and deployed at scale on Apple AirPods-related production lines from 2021 to 2023.

作者：冯玮，几何算法工程师
联系邮箱：weifeng@stu.ouc.edu.cn

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